Abstract
为了提高电离层虚高测量精度,介绍了利用电离层回波相位实现高精度虚高测量的方法,并以CADI(Canadian Advanced Digital Ionosonde)电离层数字测高仪为研究平台,进行组合脉冲控制和回波相位测量分析,开展了一系列虚高测量实验,并与传统的利用回波时间延迟的虚高测量方法进行了分析比较.实验结果表明,基于回波相位的测量分析方法与回波时延测量分析方法相比,其虚高测量精度高一个量级以上,这对精确反演电离层峰下电子浓度剖面及研究电离层精细结构具有重要意义.
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