Abstract
Natural radiation is known to be a source of microelectronics failure. For instance, neutrons, protons, heavy ions, and alpha particles have all been implicated in the occurrence of soft errors in memory devices. To predict the reliability of electronics devices we developed a tool called MC-ORACLE. This Monte Carlo application is based on the common empirical soft error criterion for a critical charge deposited in a parallelepiped sensitive volume. MC-ORACLE is able to deal with complex structures composed of various materials. It provides single and multiple error cross sections as well as the soft error rate.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
