Abstract

Silicon Carbide (SiC) has been long recognized as a suitable semiconductor material for use in nuclear radiation detectors of high-energy charged particles, gamma rays, X-rays and neutrons. The nuclear interactions occurring in the semiconductor are complex and can be quantified using a Monte Carlo-based computer code. In this work, the MCNPX (Monte Carlo N-Particle eXtended) code was employed to support detector design and analysis. MCNPX is widely used to simulate interaction of radiation with matter and supports the transport of 34 particle types including heavy ions in broad energy ranges. The code also supports complex 3D geometries and both nuclear data tables and physics models. In our model, monoenergetic neutrons from D–T nuclear reaction were assumed as a source of fast neutrons. Their energy varied between 16 and 18.2 MeV, according to the accelerating voltage of the deuterons participating in D–T reaction. First, the simulations were used to calculate the optimum thickness of the reactive film composed of High Density PolyEthylene (HDPE), which converts neutral particles to charged particles and thusly enhancing detection efficiency. The dependency of the optimal thickness of the HDPE layer on the energy of the incident neutrons has been shown for the inspected energy range. Further, from the energy deposited by secondary charged particles and recoiled ions, the detector response was modeled and the effect of the conversion layer on detector response was demonstrated. The results from the simulations were compared with experimental data obtained for a detector covered by a 600 and 1300 [Formula: see text]m thick conversion layer. Some limitations of the simulations using MCNPX code are also discussed.

Highlights

  • Silicon carbide (SiC) is a prospective compound semiconductor material for fabrication of radiation detectors aimed to operate in harsh environments

  • The results show that the optimum values of the High Density Polyethylene (HDPE) thickness are shorter than proton ranges in the film, calculated using the SRIM program,[12] which are 2.74 and 3.39 mm for 16 and 18 MeV protons, respectively

  • The detector response has been simulated using the F8 pulse height tally, which provides the number of pulses depositing energy within the specified energy bins

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Summary

Introduction

Silicon carbide (SiC) is a prospective compound semiconductor material for fabrication of radiation detectors aimed to operate in harsh environments. The potential of SiC detectors to withstand high temperatures up to 700°C and high dose rates when irradiated by electrons, alpha particles, light ions, neutrons and gamma-rays have been reported.[1,2,3,4,5,6,7]. SiC detectors are being developed for high-energy charged particle, UV, X-ray, gamma-ray and neutron spectrometry. The spectroscopic performance of the SiC detectors based on high purity epitaxial material is, limited by the achievable thickness of the depletion region. Present status of the fabrication technology enables production of a good quality material and promotes active development of SiC detectors

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