Abstract
Maxwell—Wagner (M-W) theory was used to explain the dielectric relaxor behavior of BiFeO3(BFO)/Bi3.25La0.75Ti3O12(BLT) film grown on Pt/Ti/SiO2/Si substrate. The BFO film was considered to be ferroelectric film, and its temperature dependence of dielectric constant was calculated by Landau theory. BLT film was of dielectric-relaxor behavior and its temperature dependence of dielectric constant was given by Smolenski theory. The leakage currents for the BFO and BLT films were assumed to obey Poole–Frenkel emission and Schottky emission, respectively. The temperature dependent dielectric constant and loss of the BFO/BLT film were characterized, which agrees with the experiment. The enhancement of the polarization in BFO/BLT film may induced by the current leakage restraining in BFO film.
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