Maximum probing depth of low-energy photoelectrons in an amorphous organic semiconductor film

Abstract

The attenuation length (AL) of low energy photoelectrons inside a thin film of a π-conjugated organic semiconductor material, 2,2′,2″-(1,3,5-benzinetriyl)-tris(1-phenyl-1-H-benzimidazole), was investigated using ultraviolet photoelectron spectroscopy (UPS) and photoelectron yield spectroscopy (PYS) to discuss their probing depth in amorphous organic thin films. The present UPS results indicated that the AL is 2–3nm in the electron energy range of 6.3–8.3eV with respect to the Fermi level, while the PYS measurements which collected the excited electrons in a range of 4.5–6eV exhibited a longer AL of 3.6nm. Despite this still short AL in comparison to a typical thickness range of electronic devices that are a few tens of nm-thick, the photoemission signal penetrating through further thicker (18nm) organic film was successfully detected by PYS. This fact suggests that the electronic structures of “buried interfaces” inside practical organic devices are accessible using this rather simple measurement technique.