Maximum likelihood analysis of component reliability using masked system life-test data : John S. Usher and Thom J. Hodgson. IEEE Trans. Reliab.37(5), 550 (December 1988)

Abstract

Metal leaching from landfills containing end-of-life or otherwise discarded mobile phones poses a threat to the environment as well as public health. In the present study, the metal toxicity of printed wire boards (PWBs), plastics, liquid crystal displays (LCDs) and batteries of mobile phones was assessed using the Toxicity Characteristics Leaching Procedures (TCLP) and the Waste Extraction Test (WET). The PWBs failed TCLP for Pb and Se, and WET for Pb and Zn. In WET, the two PWB samples for Pb and Zn and the battery samples for Co and Cu failed the test. Furthermore, the PWBS for Ni and the battery samples for Ni and Co failed the WET in their TCLP leachates. Both, Ni and Co are the regulatory metals in only WET and not covered under TCLP. These observations indicate that the TCLP seems to be a more aggressive test than the WET for the metal leaching from the mobile phone parts. The compositional variations, nature of leaching solution (acetate in TCLP and citrate in WET) and the redox conditions in the leaching solution of the PWBs resulted in different order of metals with respect to their amounts of leaching from PWBs in TCLP (Fe > Pb > Zn > Ni > Co > Cu) and WET (Zn > Fe > Ni > Pb > Cu). The metal leaching also varied with the make, manufacturing year and part of the mobile phone tested. PWBs, plastics and batteries should be treated as hazardous waste. Metal leaching, particularly of Se and Pb, from mobile phones can be harmful to the environment and human health. Therefore, a scientifically sound and environmentally safe handling and disposal management system needs to be evolved for the mobile phone disposal.