Maximal length test pattern generation for the cryptography application

Abstract

Date security is the science and study of methods of protecting data in computer and communication systems from unauthorized disclosure and modification. With the introduction of hardware Trojans, data security becomes more critical. However Data security has evolved rapidly and have seen exciting developments in cryptography. Various algorithms are adopted for the data encryption and decryption processes for the higher level of security. Data is leaking by accessing the encrypted data over the medium of data transmission, so implementation of high security medium for data transmission has to be developed. Industries developing various techniques for verifying that programs do not leak confidential data. This paper explores a better understanding of the theoretical and practical limitations to security. By considering the pseudorandom property of cryptography, the Linear Feedback Shift Register (LFSR) based designs provides affordable intelligence security testing, facilitating their demand in VLSI chip design. It is analysed to generate maximal length random sequence to provide better cryptography. Pseudorandom sequence generator (PRSG) by LFSRs, encipherment and decipherment simulations are done using 180 nm CMOS process technology in ASIC flow, and validated using simulation results.