Abstract
The experimental dependences of the X-ray fluorescent radiation intensity on the concentration of silicon dissolved in glass based on lithium tetraborate are determined. The experimental dependences are compared to the calculated ones. It is shown that both the experimental and the calculated dependences are described by the same type of equation.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
