Abstract

The simple model of the elastic SH-plane wave scattering from the interface crackInterface crack in a joint of two half-spacesHalf-spaces is considered using the Wiener–Hopf technique. Its approximate solution is obtained for the wide crackCrack. The study focuses on the physical features that can be used to recognize interface defectsInterface defect. The far scattering field for arbitrary plane wave illumination angle, including sliding and critical ones, the effects of the mutual edge waves diffractionMutual edge waves diffraction, and the lateral waveLateral wave excitation are analyzed. The approximate expressions of the stress intensity factorsStress intensity factor (SIF) are obtained and establish their dependencies on the problem parameters. The elastic SH-mode diffractionSH-mode diffraction from the finite interface crackInterface crack in the joint of the half-spaceHalf-spaces and the layer is considered. The mode transformation properties, as well as the spectral and displacement fieldDisplacement field characteristics, are analyzed. The problem of the interface crackInterface crack recognition is discussed.

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