Mathematical expressions for simulation of supercapacitor voltammetry curves and capacitance dependence on scan rate

Abstract

A straightforward RC series circuit model was proposed to fit the cyclic voltammetry experimental data of various symmetrical electrochemical supercapacitors. The model simulated the experimental behavior for exponential dependence of capacitance on the scan rate. In this model, the zero-scan rate capacitance was considered as a constant, and the equivalent serial resistance depended on the scan rate. Neither the equivalent parallel resistance nor a possible intrinsic dependence of capacitance on applied voltage was considered in the modelling.