Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Abstract

Preface Part 1: Materials Issues and Reliability of Optical Devices 1. Reliability Testing of Semiconductor Optical Devices 2. Failure Analysis of Semiconductor Optical Devices 3. Failure Analysis using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication 4. Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation 5. Catastrophic Optical-damage in High Power, Broad-Area Laser-diodes 6. Reliability and Degradation of Vertical Cavity Surface Emitting Lasers 7. Structural Defects in GaN-based Materials and Their Relation to GaN-based Laser Diodes 8. InGaN Laser Diode Degradation 9. Radiation-enhanced Dislocation Glide - The Current Status of Research 10. Mechanism of Defect Reactions in Semiconductors Part 2: Materials Issues and Reliability of Electron Devices 11. Reliability Studies in the Real World 12. Strain Effects in AlGaN/GaN HEMTs 13. Reliability Issues in AlGaN/GaN High Electron Mobility Transistors 14. GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors 15. Novel Dielectrics for GaN Device Passivation And Improved Reliability 16. Reliability Simulation 17. The Analysis of Wide Bandgap Semiconductors Using Raman Spectroscopy 18. Reliability Study of InP-Based HBTs Operating at High Current Density Index