Abstract
We explore the contact problem of a flat-end indenter penetrating intermittently a generalized viscoelastic surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highly popular tapping-mode AFM imaging technique. By focusing on the material perspective and employing a rigorous rheological approach, we deliver analytical closed-form solutions that provide physical insight into the viscoelastic sources of repulsive forces, tip–sample dissipation and virial of the interaction. We also offer a systematic comparison to the well-established standard harmonic excitation, which is the case relevant for dynamic mechanical analysis (DMA) and for AFM techniques where tip–sample sinusoidal interaction is permanent. This comparison highlights the substantial complexity added by the intermittent-contact nature of the interaction, which precludes the derivation of straightforward equations as is the case for the well-known harmonic excitations. The derivations offered have been thoroughly validated through numerical simulations. Despite the complexities inherent to the intermittent-contact nature of the technique, the analytical findings highlight the potential feasibility of extracting meaningful viscoelastic properties with this imaging method.
Highlights
Several current applications demand physical understanding of soft dissipative materials at the nanoscale [1,2,3,4,5]
We have studied thoroughly the physics of a flat-punch atomic force microscope (AFM) probe tapping on a generalized linear viscoelastic surface containing an arbitrary number of characteristic times
We have derived analytical expressions for force in time and for two energy quantities frequently used in tapping-mode AFM, namely the average dissipated energy and the virial, in terms of meaningful viscoelastic material properties
Summary
Several current applications demand physical understanding of soft dissipative materials at the nanoscale [1,2,3,4,5] This type of materials, such as polymers, biological cells and even some metals, has been successfully described with linear viscoelastic theory [6,7,8] and its characterization at the nanoscale has been performed by various techniques, where the atomic force microscope (AFM) has played a prominent role. The analytical simplicity afforded by permanent tip–sample contact, comes with the shortcomings of loss of accuracy in the acquisition of the topography and sample damage induced by constant tip drag. These methods are prone to significant tip wear and contamination which could make quantitative characterization unreliable due to constant changes in tip geometry
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