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Abstract
The main steps for characterization and measurement of microwave absorbent materials in the 1–10 GHz range are introduced. The coaxial reflection-transmission type of material parameter measurement is analyzed in detail and the main measurement error is corrected. The microscopic material particle parameter measurement concept is also presented using different mixing rule laws to determine the material parameters of the single particles from the macroscopic parameters. Two-dimensional FDTD simulations have been used to model the behavior of mixed electric and magnetic type of material.
Highlights
Antireflection coatings are widely used for optical and high-frequency applications such as microwave absorbing materials for electromagnetic compatibility or decreasing RCS for stealth applications
In order to extend the performance of antireflection coatings to wider ranges of frequency and incidence, a multilayered structure has to be considered
The optimization of such complex architectures may consist in measurement of macroscopic and microscopic material parameters
Summary
Antireflection coatings are widely used for optical and high-frequency applications such as microwave absorbing materials for electromagnetic compatibility or decreasing RCS for stealth applications. In order to extend the performance of antireflection coatings to wider ranges of frequency and incidence, a multilayered structure has to be considered. The optimization of such complex architectures may consist in measurement of macroscopic and microscopic material parameters. This article presents a new calibration flow graph analysis and analytical equation to evaluate the correcting terms. Measurement and simulated results are presented to validate the calibration proposed and to correct the sample size deviation [1]
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