Abstract
An evanescent field sensor to identify materials by contact has been demonstrated using a 3D coupled waveguide array. The array is formed by imbedding layered silicon nitride stripes as waveguide cores in polymer cladding and the top cladding layer is etched open for material sensing. When objects with different refractive indexes are placed on the surface of the sensor, the evanescent field is disturbed and both the local modal distribution and the coupling condition with the connecting segments are altered, leading to different interference patterns when light from the output facet is captured and focused onto a camera. We have chosen four conventional materials for test: polymer, silicon, aluminum and silver. The sensor is able to tell them apart with distinctive patterns. In addition, the sensor can identify the location of the contact, once the material is recognized. This simple and low-cost device, supported by the recent development of image recognition technology, may open up new possibilities in chip-based sensing applications.
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