Material characterization with top-hat cw laser induced photothermal techniques: A short review

Abstract

In this work, we present a short review of the recent development of the theoretical models for top-hat cw laser induced spectroscopies of thermal lens and thermal mirror. With the same probe and top-hat excitation lasers, an apparatus is set up to concurrently measure both thermal lens and thermal mirror effects of transparent samples. With the theoretical models and the experimental apparatus, not only optical and thermal properties are measured, but also the fluorescence quantum coefficient and the temperature coefficient of the optical path length of a fluorescent sample are simultaneously determined with no need of any reference sample. Mechanical properties also could be measured. Opaque samples are also studied using top-hat cw laser thermal mirror and top-hat photothermal deflection techniques to determine thermal properties (e.g., thermal conductivity and unit volume specific heat). This work shows that the combined top-hat cw laser photothermal techniques are useful for nondestructive evaluation of both transparent and opaque samples with a less expensive non-TEM00 Gaussian laser.