Abstract
AbstractWe report in this paper how electrospray mass spectrometry (ESMS) and nanospray mass spectrometry (NMS) are promising for analyzing precursors and nano-scale semiconductor (IIVI) materials up to 1.5 nm and mixed valence clusters (Co/Cd). We show that both ion modes in ESMS and NMS provide insight concerning the structure analysis, the composition and the stability of these materials.
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