Abstract
Powders of metals (magnesium and tungsten) and nonmetals (boron and silicon) are used to analyze Fluralit-4 Teflon (polytetrafluoroethylene) powder by means of surface-activated laser desorption/ionization. It is shown that this technique allows the degree of Teflon degradation to be determined. It is established that when silicon powder is used as a matrix, it is possible to register both low molecular weight products of the degradation of Teflon and its oligomeric products in the range of up to 1400 Da. The Teflon mass spectra contain two series of ions: one for saturated components and one for unsaturated components.
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