Abstract
Since previous measurements of mass m and relaxation time τ of domain walls in NiFe films were controversial, they were derived from forced oscillations of individual 90° Néel walls, observed by stroboscopic electron microscopy. The values m = 1.4 × 10 -7 kg/m 2, τ = 50 ns were determined for 40 nm thick films, corroborating interrupted field pulse measurements.
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