Abstract
Here we report on martensitic transformation in thin glass-coated Ni-Mn-Ga Heusler-type microwire with a high Ni content. Martensitic transformation has been observed below room temperature in the microwire annealed at 1000 K during 1 h. No signs of martensitic transformation were found in the microwires annealed at lower temperature of 833 K. Curie temperature showed strong dependence on annealing temperature and the presence of the glass coating.Results were discussed in frame of internal stresses influence, arising in the metallic nucleus of the microwire due to the fabrication involving rapid solidification of metallic nucleus surrounded by the glass coating. Continuous wire drawing, quenching water jet that influence the stresses distribution and the difference of thermal expansion coefficients between glass and metallic alloy were considered.
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