Abstract
The typical conventional CT system employs the digital integrating sensor, for which it is difficult to identify attenuation characteristics of different energy X-ray. This paper focuses on X-ray spectral imaging technology based on MARS X-ray spectral CT system. We scanned some singular element materials and a multi-material phantom with different energy X-ray bins, obtained some material K-edge characteristic curves, and reconstructed CT images of multi-material phantom. By means of CT images based on material K-edge characteristics, we can discriminate different materials or recognize more attenuation information of different materials. Compared to conventional X-ray CT technology, X-ray spectral CT can provide much richer attenuation information.
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