Marked Point Process Model for Curvilinear Structures Extraction

Abstract

In this paper, we propose a new marked point process (MPP) model and the associated optimization technique to extract curvilinear structures. Given an image, we compute the intensity variance and rotated gradient magnitude along the line segment. We constrain high level shape priors of the line segments to obtain smoothly connected line configuration. The optimization technique consists of two steps to reduce the significance of the parameter selection in our MPP model. We employ Monte Carlo sampler with delayed rejection to collect line hypotheses over different parameter spaces. Then, we maximize the consensus among line detection results to reconstruct the most plausible curvilinear structures without parameter estimation process. Experimental results show that the algorithm effectively localizes curvilinear structures on a wide range of datasets.