Abstract
A multibackground March test (March-76N) for a model of static neighborhood pattern sensitive faults (NPSFs) in N ´ 1 random-access memories is presented. March-76N is able to cover both simple and linked NPSFs. As any other test dedicated to the NPSFs, March-76N assumes that the storage cells are arranged in a rectangular grid and the mapping from logical addresses to physical cell locations is known completely. With a length of 76N, this March test is more efficient than other published tests dedicated to this model. Ill. 4, bibl. 16, tabl. 4 (in English; abstracts in English and Lithuanian).DOI: http://dx.doi.org/10.5755/j01.eee.119.3.1369
Highlights
Rapid increase of density in the integrated circuits has an immediate effect upon memory testing
As a result of the increasing coupling effect triggered by the growing density of memory circuits, the patternsensitive fault (PSF) is becoming an important fault model
The PSF model is a type of coupling fault, with several aggressor cells (4, 9 etc.) and only one victim cell
Summary
Rapid increase of density in the integrated circuits has an immediate effect upon memory testing. C) Depending on the way FPs manifest themselves, they can be divided into simple faults and linked faults: Static NPSF (SNPSF): the base cell is forced to a certain value when the aggressor cells have a certain pattern. 1100; Active NPSF (ANPSF): a certain transition in one of the aggressor cells forces the victim cell to change its value when the other aggressor cells ( called enabling cells) have a certain pattern An example of this class of faults is. It is unnecessary and unrealistic to consider all possible patterns of all the memory cells, simplified models of neighborhood pattern sensitive faults (NPSF) have been introduced In these models, the aggressor cells are limited to the physical neighborhood of the victim cell. Depending on the behavior of the fault, the NPSFs can be divided into three classes [10], namely: N
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