Abstract
A memory fault model regarding the unlinked static three-cell coupling faults in n × 1 random-access memories is discussed. This model is an extension of the well-known model of unlinked static two-cell coupling faults. Because this model of three-cell coupling is limited to the physically neighbouring memory cells, it can also be considered a neighbourhood pattern-sensitive model. An efficient march test algorithm able to cover this reduced model of three-cell coupling is presented in this letter.
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