Abstract
Scattering-type scanning near-field optical microscopy (s-SNOM) enables mapping of nanoscale field distributions in two dimensions. However, the standard s-SNOM technique lacks direct resolving ability along the vertical direction, therefore unable to provide full three-dimensional near-field responses. Here, we develop a reconstruction technique that enables s-SNOM to collect a three-dimensional response cube of near-field interaction. The technique also allows a new operational mode of s-SNOM based on the characteristic decay range of near-field interactions. As a demonstration, the bound near-field at the sides of a polaritonic boron nitride nanotube is revealed through the collection of the near-field response cube. The graphene boundary and discontinuities are revealed by the near-field decay range mapping. The reconstruction s-SNOM technique extends the capability of s-SNOM and is generally applicable for a wide range of nanoscale characterizations that are suitable for s-SNOM, such as characterizations of plasmonic and polaritonic nanostructures.
Highlights
Atomic force microscopy (AFM) based near-field microscopy is a useful tool in studying the electromagnetic fields around nanophotonic materials and structures
Does the high spatial resolution of near-field microscopy match the characteristic scale of nanostructures, and the nearfield probe allows direct detection of non-propagating electromagnetic fields that are not accessible for traditional optical microscopy
Near-field scanning optical microscopy (NSOM) allows for three-dimensional mapping of local electric fields through two-dimensional inplane scanning coupled with a series of well-controlled probe heights over the sample surface.[5,6]
Summary
Atomic force microscopy (AFM) based near-field microscopy is a useful tool in studying the electromagnetic fields around nanophotonic materials and structures. (Received 3 March 2017; accepted 22 May 2017; published online 30 May 2017)
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