Manipulation and Trapping of Particles in the Ray Optics Regime Using DPS-DNG Layered Structures: Toward Calibration and Precision of Optical Tweezers

J H Shahbazian

doi:10.13189/ujpa.2014.020306

Abstract

Optical traps or tweezers use the forces exerted by structured beams of light to confine and manipulate non-intrusively and non-destructively microscopic objects including living cells and bacteria, with high accuracy. This technique provides unique means to control the dynamics of small particles and played a revolutionary role in areas of the physical and biological sciences. This manuscript aims at absolute force calibration of optical beams, using new technique and structure of DPS (Double Positive index of refraction)-DNG (Double Negative index of refraction)layered structure to manipulate targets in the far filed with high resolution trapping scheme. Using this layered structure which acts as a tunable optical band-pass filter would help to calibrate and control the forces on the target(s). The band-pass effect varies with the periodic parameters of the DPS-DNG structure, applied electric and magnetic field, incidence angle and frequency.

Highlights

Optical tweezers have transformed the ordinary light microscopes from a device for passive observation to a versatile tool for active manipulation and controlled measurement of objects
In spite the fact that the radiation pressure was well known at the beginning of the seventeen century when Johannes Kepler in De Coriolis (1619) published that the radiation pressure causes the tail of comets always point away from the sun no matter where it is located during its journey, but just recently was applied to manipulating particles [1,2,3,4,5,6,7]
The DPS-double negative index of refraction (DNG) test bench would manipulate the refraction of the electromagnetic waves and afterward the force acting on the subwavelength size target

Summary

Introduction

Optical tweezers have transformed the ordinary light microscopes from a device for passive observation to a versatile tool for active manipulation and controlled measurement of objects. The objective here is to study the manipulation and trap of up to nanometer size dielectric particles with manipulating the electromagnetic waves using layered periodic photonic crystals made with alternating layers of double positive (DPS, ordinary dielectric) materials and double negative materials (DNG). The DPS-DNG test bench would manipulate the refraction of the electromagnetic waves and afterward the force acting on the subwavelength size target.

Results

Conclusion