Abstract
The tip of an atomic force microscope is used to create carbon nanotube junctions by changing the position and shape of individual single-walled carbon nanotubes on a SiO2 surface. With this manipulation technique, we are able to bend, buckle, cross (see Figure), and break nanotubes, and to unravel a nanotube “crop circle” into a single tube. Tapping-mode atomic force microscopy measurements of the height of a carbon nanotube on the surface always yield values smaller than the nanotube diameter. Variation of the scan parameters shows that this is due to a tapping deformation by the tip. The tapping deformation of manipulated nanotube crossings and buckles is discussed as well.
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