Abstract
Manganese spinel ferrite (MnFe/sub 2/O/sub 4/) films were deposited at the atomic scale. In the depositions, laser pulses alternately impinged MnO and Fe/sub 2/O/sub 3/ targets and sequentially deposited thin layers (/spl sim/5 /spl Aring/) of MnO and Fe/sub 2/O/sub 3/ on MgO substrate, which is referred to as "artificial" films. The X-ray diffraction measurements showed that the artificial films were of spinel structure. Auger spectroscopy measurements showed that the chemical composition of the artificial ferrites were consistent with that of standard films deposited using a single target of MnFe/sub 2/O/sub 4/. However, extended X-ray absorption fine spectroscopy showed that the artificial growth technique affected the cation distribution to be different from the standard films. As a result, the magnetic properties of the artificial films, including Ne/spl acute/el temperature, uniaxial and in-plane anisotropy, were different from the standard films.
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