Abstract
New lamellar Al2O3/ZrO2 (Y2O3) eutectics were obtained using seeding melt-grown method. The orientation relationship and interface structure of the eutectics were investigated by means of transmission Kikuchi diffraction and transmission electron microscopy. The unusual orientation relationship of the new Al2O3/ZrO2 (Y2O3) eutectics was (1 0 12¯)Al2O3 || (11¯1)ZrO2 and [0 2 2¯1]Al2O3 || [1 1 2]ZrO2 and the interface plane was (1 0 12¯)Al2O3 || (11¯1)ZrO2 with a 4.32% misfit. Furthermore, the possible preferred growth directions on the interface were predicted, which were uncommon low index directions. These results indicate that the interface structure is the leading factor of the growth behavior in binary eutectics. It can be demonstrated that the seeding melt-grown method offers a pathway to tailor the interface and growth direction of the directionally solidified eutectics.
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