Magnetoresistive Memory with Ultralow Critical Current for Magnetization Switching

Abstract

AbstractThe data writing and thermal stability of information storage are studied theoretically for a magnetic random access memory (MRAM) composed of a magnetic tunnel junction or multilayer exhibiting giant magnetoresistance. The theoretical analysis focuses on the magnetization switching in the “free” layer of a MRAM cell, which is induced by a spin‐polarized current imposing a spin‐transfer torque (STT) on the magnetization. It is shown that the writing current in such an STT‐MRAM reduces dramatically near a spin reorientation transition (SRT) driven by lattice strains and/or surface magnetic anisotropy and even tends to zero under certain conditions. In particular, at the size‐driven SRT in the perpendicular‐anisotropy CoFeB‐MgO tunnel junctions, the critical current densities for magnetization reorientations between the parallel and antiparallel states are expected to fall to low values of about 1.3 × 105 and −3.3 × 104 A cm−2. Remarkably, STT‐MRAMs may combine low writing current with very high thermal stability of information storage (retention over 10 years) even at a high density ≈500 Gbit inch−2.