Abstract
Surfaces of patterned NiFe strip-shaped thin films of 15–30nm thickness were modified by nanowires of NiFe oxide. The NiFe oxide was fabricated by the atomic force microscopy (AFM) nano-oxidation technique. The anisotropy magnetoresistance was measured in order to study the effect of the nanowires in the magnetization reversal process. The domain wall was pinned at the nanowires of the NiFe oxide. It was indicated that the propagation of domain wall could be controlled by the AFM nanolithography.
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More From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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