Abstract
The polycrystalline [Fe/Ag/Co/Ag]×3 asymmetric multilayer film was prepared by the UHV magnetron sputtering method on silicon. In-plane magnetization measurements showed structured hysteresis loops. Magnetoresistance (MR) measurements revealed giant magnetoresistance effect with magnitudes in 0.14–0.21% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an indistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on incomplete domain alignment model for polycrystalline magnetic films.
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