Abstract
AbstractOriented and non-oriented thin films of silver(I) telluride, Ag2Te, were prepared by e-beam evaporation, vapor transport technique and Chemical Vapor Deposition (CVD). Crystallinity and orientation of the films were studied by Θ−2Θ XRD, rocking curve and pole figure measurements. The origin and conditions for the oriented growth are discussed. Special microdevice was prepared by photolitography from the oriented films of Ag2Te in order to investigate magnetoresistance (MR) in this material. It was proved that the reported earlier negative MR in Ag2Te films is a completely geometrical effect, which can be observed using non-linear arrangement of current and voltage contacts.
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