Abstract
We have developed an apertureless Scanning Near field Optical Microscope (SNOM) in transmission, devoted to near field magneto-optics. Our apertureless SNOM combines an inverted optical microscope, which has been adapted to Faraday effect imaging, with a commercial stand-alone Scanning Probe Microscope, used in Atomic Force Microscope (AFM) mode. Two different probes are validated as apertureless SNOM tips: a home-made etched tungsten wire and a commercial AFM silicon probe. We present and analyze preliminary images of the doMayn structure in iron garnets. They indicate a SNOM resolution clearly in the sub-micrometric range. Besides, the near field magneto-optical image presents some unexpected features, not revealed in far field images.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
