Abstract
In this paper the resonance-VSM (based on the original Foner solution) designed for measurements of ultrathin films is presented. The measuring head is universal and could be working in the Helmholtz coils as well as in an electromagnet. The resolution of the magnetic field was 0.01 Oe and the sensitivity measurements of magnetic moment 10 −4 emu. The dynamic parameters of the sample vibration are: maximum of amplitude 8 mm and frequency 65 < f < 85 Hz. The test measurements were performed on epitaxial monolayers of Fe.
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