Abstract
Experimental investigations on magnetic anisotropy energies of epitaxial ${\text{Fe}}_{100\ensuremath{-}x}{\text{Si}}_{x}$ thin films on MgO(001) have been extended to low Si concentration. We separated different contributions and found that the strain-induced magnetocrystalline anisotropy term favors an in-plane easy axis for the ${\text{Fe}}_{94.5}{\text{Si}}_{5.5}$ sample, but an out-of-plane easy axis for the ${\text{Fe}}_{75}{\text{Si}}_{25}$ sample. First principles calculations using the highly precise full potential linearized augmented plane wave method indicated that this results from the sign change in magnetoelastic coupling coefficient in the composition range. Analysis in electronic structures provides clear insights for the understanding of magnetic anisotropy in these films.
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