Abstract
We present a technique to detect quantum capacitance in the presence of strong density profile effects. We demonstrate our technique by performing capacitance-voltage subband spectroscopy on a system of coupled electron layers in a heterostructure which is the superposition of a wide parabolic well and multiple square wells. Events inducing Fermi level variations are detected as features in the derivative profile dC/dVg as the electron gas width is reduced by an applied gate voltage. Quantum features are differentiated from density profile effects by considering differences in derivative profiles dC/dVg for increasing magnetic field perpendicular to the electron layers. Results are compared with theory.
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