Magneto-transport properties of semiconductors from flatband magnetocapacitance spectroscopy

Abstract

We introduce the flatband magnetocapacitance measurement to study magnetotransport properties in bulk semiconductors. This method is better, in some cases, than the Hall measurement because it can avoid some problems inherent to the latter method, such as the influence of the surface conducting layer, the carrier mobility, and the sample geometry correction factor. By using this experimental method some interesting phenomena concerning magnetotransport properties in an n-type InSb sample were observed, including Shubnikov–de Haas oscillations, resonant defect states, conduction process transitions, and the metal–insulator phase transition. The experimentally determined magnetotransport properties for the InSb sample are compared with those reported in literature.