Abstract
We report an experimental study on transversal Kerr effect (TKE) in magnetic oxide semiconductors TiO 2−δ:Co. The TiO 2−δ: Co thin films were deposited on LaAlO 3 (0 0 1) substrates by magnetron sputtering in the argon–oxygen atmosphere at oxygen partial pressure of 2×10 −6–2×10 −4 Torr. It was obtained that TKE spectra in ferromagnetic samples are extremely sensitive to the Co-volume fraction, the crystalline structure, and technology parameters. The observed well-pronounced peaks in TKE spectra for anatase Co-doped TiO 2−δ films at low Co (<1%) volume fraction are not representative for bulk Co or Co clusters in TiO 2−δ matrix that indicates on intrinsic ferromagnetism in these samples. With increase of Co-volume fraction up to 5–8% the fine structure of TKE spectra disappears and magneto-optical response in reflection mode becomes larger than that for thick Co films
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