Abstract
The light wavelength λ dependence of Kerr rotation angle θk in the multilayered films composed of Pt and MnSb layers have been investigated. The relatively flat peak in the θk-λ spectrum of the as-deposited Pt/MnSb films changed to apparently sharp one by post-annealing at temperature of 400°C for 150 minutes. The θk of the multilayered film with 13 A-thick Pt and 50 A-thick MnSb layers had a maximum as high as 0.83° at wavelength of 630 nm. This value is smaller than that (1.2°) of the bulk PtMnSb heusler alloy. It was found that the peak position of the spectra shifted to short wavelengths by increasing the thickness of the Pt layer.
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