Abstract
Magnetic linear dichroism in threshold photoemission has been exploited to obtain magnetic contrast in a photoemission electron microscope using a mercury arc lamp. The dichroism at threshold can be described similar to the magneto-optical Kerr effect in the region of visible light. The asymmetry of electron intensity observed for a 100 nm polycrystalline Fe film on silicon is A=(0.37+/-0.05)%. The asymmetry occurs for the geometry of the transverse Kerr effect. For unpolarized light the asymmetry was about half the value observed for linearly polarized light. Threshold photoemission microscopy has a large potential for high resolution magnetic domain imaging with fast data acquisition.
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