Abstract
In this paper we report upon a study of the magnetization reversalmechanisms in Co/Pt thin films at elevated temperatures. An alternatinggradient force magnetometer has been modified in order to perform measurementsat elevated temperatures. The data obtained from hysteresis loops andremanence curves measured at high temperature has been used to analysereversal mechanisms which are discussed in terms of a well establishedtwo-coercivity model. The high sensitivity of the magnetic measurements revealsubtle temperature dependent changes in the magnetic characteristics of thefilms, which are attributed to thermally induced modifications of the energybarriers to magnetization reversal and film microstructure. The evolution ofdomain structure during reversal has been examined by magnetic forcemicroscopy for a sample placed in varying remanent states at elevatedtemperatures and is found to correlate with the two-coercivity model.Additionally, a method by which samples may be demagnetized in situ atelevated temperatures is discussed along with domain wall motion induced bythe stray field from magnetic force microscope tips.
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