Magnetization of 2.6 T in gadolinium thin films

Abstract

There is renewed interest in rare-earth elements and gadolinium in particular for a range of studies in coupling physics and applications. However, it is still apparent that synthesis impacts understanding of the intrinsic magnetic properties of thin gadolinium films, particularly for thicknesses of topicality. We report studies on 50 nm thick nanogranular polycrystalline gadolinium thin films on SiO2 wafers that demonstrate single-crystal like behavior. The maximum in-plane saturation magnetization at 4 K was found to be 4πMS4 K = (2.61 ± 0.26) T with a coercivity of HC4 K = (160 ± 5) Oe. A maximum Curie point of TC = (293 ± 2) K was measured via zero-field-cooled–field-cooled magnetization measurements in close agreement with values reported in bulk single crystals. Our measurements revealed magnetic transitions at T1 = (12 ± 2) K (as deposited samples) and T2 = (22 ± 2) K (depositions on heated substrates) possibly arising from the interaction of paramagnetic face-centred cubic grains with their ferromagnetic hexagonal close-packed counterparts.