Magnetization distribution in submicrometer iron-nickel antidot arrays patterned by a focused ion beam

Abstract

Antidots of size 0.5 µm are prepared by patterning iron-nickel films with a focused ion beam. The magnetization distribution in antidot arrays is examined with Lorentz transmission electron microscopy. It is shown that one side of the array makes an angle of about 20° with the easy magnetic axis of the film. Magnetization reversal in the direction close to the easy magnetic axis starts with domain nucleation at the antidot edges that are perpendicular to the applied field and adjacent to the unpatterned region of the film, and propagates as the domain walls move. Magnetization reversal in the direction close to the hard magnetic axis starts with magnetization rotation outside the patterned region at the antidot edges and propagates as the domain walls execute a complicated motion. It is demonstrated that some areas between the edges of adjacent antidots can carry information bits. Results obtained are explained in terms of competition between the demagnetizing energy, energy of internal anisotropy, and misorientation effect. The feasibility of such structures as high-density storage elements is discussed.