Abstract
A method for measuring cross-track correlation length s of thin-film media in different DC demagnetized states has been developed. The method utilizes spectrum analysis of reverse DC erase noise and an improved technique for in-situ remanence curve measurements with negligible demagnetizing field effects. It was found that the value of s, with a typical order between 0.01 mu m and 0.1 mu m, is a slow-varying function of the remanent magnetization near the coercive remanent state. It was also found that recording media noise is approximately proportional to s.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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