Magnetization and Magnetic Microscopy Studies in Fe Thin Films

Abstract

This paper reports the magnetic domain imaging and magnetization studies carried out on Fe thin films grown with different thicknesses, namely, 5, 15 nm, 30 nm, 50 nm, 75 nm and 100 nm. Films were grown on Si at two different substrate temperatures, namely, room temperature and 550°C. Based on the detailed studies carried out, it was observed that Fe layer thickness and substrate temperature are important control parameters in tuning the magnetic anisotropy along the in-plane (IP) or out-of-plane (OOP) directions. A crossover from surface to volume anisotropy has been demonstrated with change in film thicknesses. Domain imaging studies carried out on Fe films grown at different substrate temperatures and with different thicknesses aided us to understand the magnetic anisotropy and magnetization reversal mechanisms.