Abstract
The critical current density, Jc, of metal-organic deposition process using trifluoroacetates (TFA-MOD) based YBCO films was measured between 20 K and 77 K in magnetic fields up to 9.5 T as a function of the field direction. C-axis oriented YBCO films was deposited on LaAlO/sub 3/ single crystalline substrates and also on CeO/sub 2/ buffered IBAD (YSZ/Hastelloy) substrates by TFA-MOD method. The obtained Jc values at 77 K and 0 T were 7 and 1.7 MA/cm/sup 2/ for LaAlO/sub 3/ and IBAD substrates, respectively. High Jc values over 10/sup 5/ A/cm/sup 2/ were maintained up to 4 T (B//c-axis) for the LaAlO/sub 3/ substrate and up to 3 T (B//c-axis) for the CeO/sub 2/ buffered IBAD substrate. These results imply that TFA-MOD with simple fabrication process is very promising for the practical YBCO coated conductor. And the dependences on temperature and angular of the Jc at various external magnetic fields for some different thicknesses YBCO films was reported.
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