Abstract
Epitaxic thin and ultrathin films on surfaces allow crystallographic phases that do not occur naturally in the bulk to be stabilized. They also offer new possibilities for an improved understanding of soft X-ray photoabsorption in magnetic systems. Data collected using the Elliptically Polarizing Undulator at BL 5.2 of the Stanford Synchrotron Radiation Laboratory are presented herein. Fe, Co and Ni films were prepared on Cu(100) surfaces. L2,3-edge spectra were recorded with circular and linear light. Fresnel diffractometry was used to quantify the degree of transverse beam coherence. A quantitative analysis of the spectral features indicates a correlation of the spectral intensities and the transverse beam coherence. Resonant reflectivity spectra for Co ultrathin films that exhibit strong dichroism are presented. The reflectivity data indicate that interference effects of the reflected beams at the two interfaces are of importance, even for ultrathin films.
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