Abstract
We have analyzed the magnetic configuration for highly ordered ${\mathrm{Sr}}_{2}$${\mathrm{CrReO}}_{6}$ films as a function of epitaxial strain using magnetometry and x-ray magnetic circular dichroism (XMCD) measurements of Cr, Re, and O sites. The in-plane magnetic moments change significantly when tensile strain is applied. O $K$-edge XMCD indicates that O sites carry at least a portion of the bulk magnetization. Spin moment values measured for Cr match calculations incorporating spin-orbit effects, while both spin and orbital moments measured for Re sites are slightly higher than previously predicted. Finally, we discuss large changes in the x-ray absorption near-edge structure that are observed at the Cr and Re $L$ edges due to epitaxial strain.
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