Abstract
Electronic and magneto-transport studies across the Co2FeAl (CFA)/n-Si interfacial structure have been carried out. Magnetic properties of the structure have also been studied from the M–H characteristics and magnetic force microscopy (MFM) features. Surface morphology of the CFA Heusler alloy thin films studied from atomic force microscopy. X-ray diffraction and X-ray photoelectron spectroscopy data of the structure reveals the formation of CFA alloy phase with L21 structure along with few silicide phases. MFM data reveals the formation of fine domain structure with average domain size of ~17 nm with average magnetic signal strength of 0.19°. Electronic transport (I–V) characteristics shows the large reverse current as compared to forward current which indicates the spin based transport from CFA Heusler alloy side to semiconductor side. I–V characteristics performed in presence of magnetic field shows the magnetic field sensitivity for reverse bias.
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