Abstract
The magnetic state of Fe atoms at and near the interface between Fe74.3Al9.8Si15.9 sendust magnetic thin films and polycrystalline Zn–ferrite substrates has been examined using conversion electron Mössbauer spectroscopy. The thicknesses of sputtered films are 0.05, 0.08, 0.47, and 1.91 μm, and the annealing conditions are at 500 °C for 1 h. The sendust films/Zn–ferrite interface is very reactive, and the DO3-type ordered structure is not formed near the interface. This is the reason that excellent soft magnetic properties are not obtained for the films with a thickness of less than 0.47 μm. The presence of ferromagnetic Fe atoms with an internal magnetic field of 324 or 330 kOe is confirmed near the interface, indicating the formation of an Fe-rich phase such as Fe94Si6 and diffusions of Al and Si atoms from the sendust films to the interface. The thickness of the Fe-rich phase in the films has been estimated to be approximately 0.42 μm from the value (12.8 kG) of saturation magnetic-flux density for the film with 1.91 μm. It is found that a large part of Fe3+ ions in Zn–ferrite being at the interface is reduced to Fe2+ ions. The redox reaction at the interface has been proposed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
